凯发k8国际

AXIS Supra+

Imaging X-Ray Photoelectron Spectrometer

XPS概述

 

sample

 

  X射线光电子能谱,也被称为ESCA(化学分析用电子能谱),是一种几乎不受样品形态限制的表面分析技术,可提供元素及元素化学态信息。
  XPS的基本原理是光电效应,当X射线照射样品时,光子可以被样品中某一元素的原子轨道上的电子所吸收,使得电子脱离原子核的束缚,以一定的动能从原子内部发射出来,变成自由的光电子,XPS能谱仪检测到光电子的动能(Ek),而原子本身则变成一个激发态的离子。XPS谱图中峰的位置和强度提供了元素的化学状态和定量信息。
  XPS的表面灵敏度取决于光电子在材料中的传播距离,弹性散射的光电子会形成XPS中的谱峰,而非弹性散射则会形成背底。通常元素的化学状态由结合能(EB)表征,根据爱因斯坦光电发射定律有:
  EB=hν- Ek
  其中hν为入射的X射线的能量,Ek为检测到的光电子的动能。
  对于特定的单色激发源和特定的原子轨道,其光电子的能量是特征的。当固定激发源能量时,其光电子的能量仅与元素的种类和所电离激发的原子轨道有关。因此,凯发k8国际可以根据光电子的结合能定性分析物质的元素种类。当原子所处的化学环境发生变化时,内壳层的电子的结合能也会发生变化,在谱图上变现为谱峰出现位移(化学位移),就可以通过化学位移来区分元素的化学态。

 

 

关于Kratos

 

  Kratos位于英国曼切斯特,是最早生产商品化X射线光电子能谱仪(XPS)的厂家之一,也是业界有口皆碑的XPS品牌,现在是世界上最大的分析仪器制造公司凯发k8国际公司的全资子公司。早在1969年,Kratos(当时的AEI)就推出了第一台商用的电子能谱仪ES-100,自此开启了Kratos卓越和创新的五十多年XPS发展史。

xps
Kratos工厂剪影

  Kratos 与凯·西格巴恩(Kai Siegbahn)(瑞典物理学家,诺贝尔物理奖获得者)
  凯·西格巴恩(Kai Siegbahn因致力于研发一种用电子检测复合材料成分和纯度的新技术而于1981年荣获诺贝尔物理学奖,被公认是用化学分析用电子能谱发展化学分析技术的带头人。
  1988年,Kratos收到了一封来自凯·西格巴恩博士的信,信中写道:"在ESCA技术发展的早期,我有幸与AEI公司(现在的Kratos)的几位员工合作,设计了第一台ESCA仪器。我很高兴看到这种仪器是如何开发出来以满足科学与工业需求的。祝愿你们在工作中取得不断的成功!"

xps

 

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领先的表面分析技术


  Kratos公司作为XPS领域的领导者秉承着传承经典的理念,推出了最新一代产品,全自动、成像型多技术X射线光电子能谱仪--AXIS SUPRA+。集样品全自动传输、全自动分析、智能数据采集处理于一体,体现了便捷性;拥有多种X射线源、大半径双层能量分析器,杰出的荷电中和技术,使其获得了最优异的性能;通过丰富的硬件接口和灵活的软件接口,具备了多种功能附件和完善的表面分析技术。

xps
AXIS SUPRA+

 

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